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Home For Work IC Handler IC Handler Epson NS8160MS IC Test Handler

Epson NS8160MS IC Test Handler

Product Models displayed on this website may be available in certain regions only.

Designed to Deliver Higher Performance and Throughout for All Your Testing Needs

High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.

    • Up to 16 site testing capability
      Testing area from 264mmx 149mm
      Up to 240kgf contact force
      UPH - up to 13,500 (Ambient) & 
      Up to 8,200 (High Temperature)

Blazing Fast Speeds
Enjoy high-speed transfer, testing and sorting of chip packages of 13,500 chips per hour with a contact force of up to 240kgf.
Extreme High-temperature Support
Test chips at temperatures as high as 155°C and easily recover from jams during high-temperature use.
Support for Wide Socket Pitches
With a layout that accommodates even wide socket pitches, conveniently test large numbers of chips, including high-frequency (RF) chips.

Devices Handled:

Min. 3 x 3 to Max. 50 x 50 (Lead pitch: 0.4mm or more) *1

Test Mode:

Test Mode: 16-site (8 x 2)
8-site (4 x 2)
Square 4-site (2 x 2)
In-Line 4-site (4 x 1)

Testing Area:

Testing Area: 264 x 149 mm

Standard Socket Pitch (mm):

Standard Socket Pitch (mm): X: 30 Y: 60

Heating Method:

Heating Method: Heating Plate

Index Time:

Index Time *2 (common in Ambient and High Temperature modes): 0.42 sec (up to 160 kgf)*2
0.58 sec (up to 240 kgf)*2

Max. Contact Force:

Max. Contact Force: 240 kgf

Maximum Throughput (units per hour):

Ambient Temperature: 13,500 unitsHigh Temperature: 8,200 units


Binning: Max. 6 bins (Auto 3, Manual 3)


Tray: JEDEC (135.9 x 315.0 mm)

Temperature Accuracy:

Temperature Accuracy: 50 - 90°C ±2°C
90 - 155°C ±3°C

Handler Dimensions (D x W x H):

Handler Dimensions (D x W x H): 1,500 x 1,860 x 2,000 mm *3


Weight: 1,090kg

Power Requirements:

Rated Voltage/Frequency/Current: Single Phase 200 - 240 V AC, 50/60 Hz, 6 kVA